Methods and apparatus to measure a voltage on an integrated...

Details Methods and apparatus to measure a voltage on an integrated... Methods and apparatus to measure a voltage on an integrated...

2006-10-27

2008-12-16

Williams, Howard (Department: 2819)

Coded data generation or conversion

Analog to or from digital conversion

Analog to digital conversion

C341S155000, C324S765010

Reexamination Certificate

active

07466259

ABSTRACT:
Methods and apparatus to measure a voltage on an integrated circuit are disclosed. An example method to measure a voltage on an integrated circuit provides a reference signal to a first input of an encoder, provides a signal having a first voltage to a second input of the encoder, varies the reference signal from a second voltage to a third voltage, determines a first time value associated with a change in a state of an output of the encoder during the varying of the reference signal, and measures the first voltage based on the first time value.

REFERENCES:
patent: 4323887 (1982-04-01), Buurma
patent: 4908576 (1990-03-01), Jackson
patent: 6809541 (2004-10-01), Bu et al.
patent: 60259018 (1985-12-01), None
Millman, J. Microelectronics Digital and Analog Circuits and Systems; copyright 1979 McGraw-Hill Publishing Inc. ISBN 0-07-042327-X; p. 610.

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