Methods and apparatus for testing an integrated circuit

Details Methods and apparatus for testing an integrated circuit Methods and apparatus for testing an integrated circuit

2007-09-04

2007-09-04

JeanPierre, Peguy (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C341S144000

Reexamination Certificate

active

11272589

ABSTRACT:
In a first aspect, a method of testing an analog circuit is provided. The method includes (1) providing the analog circuit with a screening circuit adapted to cause the analog circuit to function like a logic gate during a test; and (2) applying digital signals to the analog circuit to test the analog circuit at a wafer level so as to detect a defect in one or more components of the analog circuit. Numerous other aspects are provided.

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