Methods and apparatus for testing a component

Details Methods and apparatus for testing a component Methods and apparatus for testing a component

2004-07-30

2008-10-14

Mariam, Daniel G (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S149000, C324S238000, C348S125000

Reexamination Certificate

active

07436992

ABSTRACT:
A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.

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