Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2007-11-20
2007-11-20
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S076150, C374S175000
Reexamination Certificate
active
11001999
ABSTRACT:
Methods and apparatus for reducing the thermal noise integrated on a storage element are disclosed. One embodiment of the invention is directed to a sampling circuit comprising a sampling capacitor to store a charge, the sampling capacitor being exposed to an ambient temperature. The sampling circuit further comprises circuitry to sample the charge onto the capacitor, wherein thermal noise is also sampled onto the capacitor, and wherein the circuitry is constructed such that the power of the thermal noise sampled onto the capacitor is less than the product of the ambient temperature and Boltzmann's constant divided by a capacitance of the sampling capacitor. Another embodiment of the invention is directed to a method of controlling thermal noise sampled onto a capacitor. The method comprises an act of independently controlling the spectral density of the thermal noise and/or the bandwidth of the thermal noise.
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Examination Report dated Mar. 6, 2007 for corresponding European Application Serial No. 05 738 010.7.
Kapusta, Jr. Ronald A.
Nakamura Katsufumi
Analog Devices Inc.
Deb Anjan
Wolf Greenfield & Sacks P.C.
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