Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-09-13
2005-09-13
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C714S742000, C714S726000, C714S723000
Reexamination Certificate
active
06944558
ABSTRACT:
A list of waveforms is received (the list being one that is to be driven to or received from a pin of a device under test, and each waveform in the list being associated with a weight). For each of at least two waveforms in the list, a number of test sample points lost by masking the waveform with a particular parent waveform in a child-parent waveform map is calculated. The number of lost test sample points is determined by 1) a difference in the number of test sample points in the waveform and the number of test sample points in the particular parent waveform, and 2) the weight associated with the waveform. In response to the calculations, a waveform masking is implemented such that the implemented waveform masking results in fewer lost test sample points than another waveform masking.
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Agilent Technologie,s Inc.
Tsai Carol S. W.
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