Methods and apparatus for memory calibration

Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning

Reexamination Certificate

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Details

C702S085000, C714S718000, C714S724000, C365S201000, C324S765010

Reexamination Certificate

active

11191418

ABSTRACT:
In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and (2) while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data. Numerous other aspects are provided.

REFERENCES:
patent: 5442642 (1995-08-01), Ingalls et al.
patent: 5629880 (1997-05-01), Negishi
patent: 6243841 (2001-06-01), Mydill
patent: 6567941 (2003-05-01), Turnquist et al.

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