Oscillators – With frequency calibration or testing
Reexamination Certificate
2007-03-13
2007-03-13
Mis, David (Department: 2817)
Oscillators
With frequency calibration or testing
C331S057000
Reexamination Certificate
active
11179874
ABSTRACT:
An integrated circuit device is provided having one or more pairs of ring oscillator circuits. Each ring oscillator circuit of the one or more pairs of ring oscillator circuits is configured to connect to at least one voltage source capable of applying a stress to a ring oscillator circuit. One or more frequency measurement circuits are each electrically connected to a respective pair of the one or more pairs of ring oscillator circuits. Each frequency measurement circuit is configured to measure a stress induced change in frequency difference of the respective pair of the one or more pairs of ring oscillator circuits.
REFERENCES:
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V. Reddy et al., “Impact of Negative Bias Temperature Instability on Digital Circuit Reliability,”40th Annual International Reliability Physics Symposium, pp. 248-254, 2002.
Y-H. Lee et al., “Effect of pMOST Bias-Temperature Instability on Circuit Reliability Performances,” Electron Devices Meeting, IEDM '03 Technical Digest, IEEE International, 4 pages, Dec. 2003.
Bhushan Manjul
Ketchen Mark B.
Mis David
Ryan & Mason & Lewis, LLP
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