Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate
2011-08-09
2011-08-09
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Physical design processing
C716S122000, C716S129000, C716S130000, C716S137000, C716S139000
Reexamination Certificate
active
07996806
ABSTRACT:
Methods and apparatus are provided for designing and laying out multi-layer circuit substrates, such as multi-layer PCBs. Dynamic vias are provided on intermediate PCB layers. Each dynamic via has features that adjust based on the trace layout of the corresponding intermediate layer. In particular, each dynamic via has a second radius R2if the via is not connected to any trace on the corresponding intermediate layer. If a trace is connected to a dynamic via, the via radius changes from the second radius R2to a first radius R1, where R1is greater than R2.
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Electronics For Imaging, Inc.
Glenn Michael A.
Glenn Patent Group
Siek Vuthe
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