Methods and apparatus for ion sources, ion control and ion...

Radiant energy – Ionic separation or analysis – With sample supply means

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S281000, C250S282000, C250S286000, C250S42300F, C250S424000

Reexamination Certificate

active

08003934

ABSTRACT:
Disclosed are methods, apparatus, systems, processes and other inventions relating to: ion sources with controlled electro-pneumatic superposition, ion source synchronized to RF multipole, ion source with charge injection, optimized control in active feedback system, radiation supported charge-injection liquid spray, ion source with controlled liquid injection as well as various embodiments and combinations of each of the foregoing.

REFERENCES:
patent: 4963736 (1990-10-01), Douglas et al.
patent: 5510613 (1996-04-01), Reilly et al.
patent: 5729014 (1998-03-01), Mordehai et al.
patent: 5739530 (1998-04-01), Franzen
patent: 5818055 (1998-10-01), Franzen
patent: 6107623 (2000-08-01), Bateman et al.
patent: 6107628 (2000-08-01), Smith et al.
patent: 6140638 (2000-10-01), Tanner et al.
patent: 6153880 (2000-11-01), Russ et al.
patent: 6225047 (2001-05-01), Hutchens et al.
patent: 6331702 (2001-12-01), Krutchinsky et al.
patent: 6515280 (2003-02-01), Baykut
patent: 6545268 (2003-04-01), Verentchikov et al.
patent: RE38138 (2003-06-01), Holkeboer et al.
patent: 6583408 (2003-06-01), Smith et al.
patent: 6627883 (2003-09-01), Wang et al.
patent: 6674071 (2004-01-01), Franzen et al.
patent: 6707037 (2004-03-01), Whitehouse
patent: 6717130 (2004-04-01), Bateman et al.
patent: 6791078 (2004-09-01), Giles et al.
patent: 6803565 (2004-10-01), Smith et al.
patent: 6914241 (2005-07-01), Giles et al.
patent: 6946653 (2005-09-01), Weinberger et al.
patent: 6949739 (2005-09-01), Franzen
patent: 6967325 (2005-11-01), Smith et al.
patent: 6977371 (2005-12-01), Bateman et al.
patent: 6979816 (2005-12-01), Tang et al.
patent: 7138642 (2006-11-01), Hieke
patent: 7205537 (2007-04-01), Nikolaev
patent: 2002/0063206 (2002-05-01), Bateman et al.
patent: 2002/0125421 (2002-09-01), Yoshinari et al.
patent: 2002/0175278 (2002-11-01), Whitehouse
patent: 2003/0136905 (2003-07-01), Franzen
patent: 2004/0031920 (2004-02-01), Giles et al.
patent: 2004/0089803 (2004-05-01), Foley
patent: 2004/0129876 (2004-07-01), Franzen
patent: 2004/0195503 (2004-10-01), Kim et al.
patent: 2004/0211897 (2004-10-01), Kim et al.
patent: 2004/0227071 (2004-11-01), Giles et al.
patent: 2004/0251411 (2004-12-01), Bateman et al.
patent: 2005/0194543 (2005-09-01), Hieke
patent: 2005/0199820 (2005-09-01), Eastham
patent: 2005/0258354 (2005-11-01), Baba et al.
patent: 2005/0269519 (2005-12-01), Kim et al.
patent: 2006/0076484 (2006-04-01), Brown et al.
patent: 0964427 (1999-12-01), None
patent: WO 99/30351 (1999-06-01), None
patent: WO 00/77822 (2000-12-01), None
patent: WO 02/097857 (2002-12-01), None
ISA/US; International Search Report and Written Opinion for International Application No. PCT/US05/05662, 8 pages, Aug. 22, 2006.
Bondarenko, P.V. et al., “A New Electrospray-Ionization Time-Of-Flight Mass Spectrometer With Electrostatic Wire Ion Guide”, Intl. J. Mass Spectrom. Ion Processes, 160, 241-258, 1997.
Hieke, A., “GEMIOS—a 84-Bit multi-physics Gas and Electromagnetic Ion Optical Simulator”, Proceedings of the 51.sup.st Conference on Mass Spectrometry and Allied Topics, Jun. 8-12, 2003, Montreal, PQ, Canada.
Hieke, A., Theoretical and Implementational Aspects of an Advanced 3D Gas and Electromagnetic Ion Optical Simulator Interfacing with ANSYS Multiphysics, Proceedings of the International Congress on FEM Technology, pp. 1.6:13, Nov. 12-14, 2003, Postdam, Germany.
Hieke, A., “Development of an Advanced Simulation System for the Analysis of Particle Dynamics in Laser based Protein Ion Sources”, Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show Nanotech 2004, Mar. 7-11, 2004, Boston, MA, U.S.A.
Krutchinsky, A.N. et al., Orthogonal Injection of Matrix-Assisted Laser Desorption/Ionization Ions Into A Time-Of-Flight Spectrometer Through A Collisional Damping Interface, Rapid Communic. Mass Spectrom., 12, 508-518, 1998.
Loboda, et al., “A tandem quadrupole/time-of-flight mass spectrometer with a matrix-assisted laser desorption/ionization source: design and performance”; Rapid Communic. Mass Spectrom., 14:1047-1057, 2000.
Tsybin, Y.O. et al., “Improved Low-Energy Electron Injection Systems for High Rate Electron Capture Dissociation in Fourier Transform Ion Cyclotron Resonance Mass Spectrometry”, Rapid Communic. Mass Spectrom., 15, 1849-1854, 2001.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods and apparatus for ion sources, ion control and ion... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for ion sources, ion control and ion..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for ion sources, ion control and ion... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2723625

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.