Methods and apparatus for inspecting materials

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S240000

Reexamination Certificate

active

07622917

ABSTRACT:
Apparatus and methods for inspecting materials such as cylindrical and tubular members are disclosed. One apparatus includes a frame that supports a magnetic coil and a detector assembly, the detector assembly having one or more magnetic detectors adapted to be spaced a first distance from the material being inspected by one or more substantially frictionless members.

REFERENCES:
patent: 2467306 (1949-04-01), Habig
patent: 3930404 (1976-01-01), Ryden, Jr.
patent: 3955425 (1976-05-01), Corneau
patent: 4027527 (1977-06-01), Bennett et al.
patent: 4041773 (1977-08-01), Hauldren et al.
patent: 4196607 (1980-04-01), Youtsey et al.
patent: 4445088 (1984-04-01), Schubel
patent: 4492115 (1985-01-01), Kahil et al.
patent: 4510447 (1985-04-01), Moyer
patent: 4555665 (1985-11-01), Stanley et al.
patent: 4602212 (1986-07-01), Hiroshima et al.
patent: 4611170 (1986-09-01), Stanley et al.
patent: 4629991 (1986-12-01), Wheeler
patent: 4636727 (1987-01-01), Kahil et al.
patent: 4675604 (1987-06-01), Moyer et al.
patent: 4677379 (1987-06-01), Arnaud et al.
patent: 4704580 (1987-11-01), Moake et al.
patent: 4710712 (1987-12-01), Bradfield et al.
patent: 4725963 (1988-02-01), Taylor et al.
patent: 4792756 (1988-12-01), Lam et al.
patent: 4823082 (1989-04-01), Nasu et al.
patent: 4912410 (1990-03-01), Morley
patent: 4934179 (1990-06-01), Biggerstaff
patent: 4945306 (1990-07-01), Lowther
patent: 5004724 (1991-04-01), De
patent: 5008621 (1991-04-01), Jiles
patent: 5030911 (1991-07-01), Lam
patent: 5059903 (1991-10-01), Otaka et al.
patent: 5140265 (1992-08-01), Sakiyama et al.
patent: 5245279 (1993-09-01), Bendzsak
patent: 5256965 (1993-10-01), Nomura
patent: 5258708 (1993-11-01), Sadeghi et al.
patent: 5303592 (1994-04-01), Livingston
patent: 5336998 (1994-08-01), Watts et al.
patent: 5424640 (1995-06-01), Levy
patent: 5430376 (1995-07-01), Viertl
patent: 5479100 (1995-12-01), Fowler et al.
patent: 5532591 (1996-07-01), Logue
patent: 5537035 (1996-07-01), Fowler et al.
patent: 5537038 (1996-07-01), Ando
patent: 5581037 (1996-12-01), Kwun et al.
patent: 5600069 (1997-02-01), Gimdt et al.
patent: 5619136 (1997-04-01), Drury
patent: 5670578 (1997-09-01), Shawl
patent: 5671155 (1997-09-01), Edens et al.
patent: 5675251 (1997-10-01), MacLean et al.
patent: 5747998 (1998-05-01), Fowler et al.
patent: 5751144 (1998-05-01), Weischedel
patent: 5914596 (1999-06-01), Weinbaum
patent: 5943632 (1999-08-01), Edens et al.
patent: 6014024 (2000-01-01), Hockey et al.
patent: 6014091 (2000-01-01), Notlemeyer et al.
patent: 6057684 (2000-05-01), Murikami et al.
patent: 6087830 (2000-07-01), Brandly et al.
patent: 6150809 (2000-11-01), Tieman et al.
patent: 6172501 (2001-01-01), Tsukuda et al.
patent: 6356072 (2002-03-01), Chass
patent: 6498451 (2002-12-01), Boules et al.
patent: 2003/0112006 (2003-06-01), Luetzow
patent: 2004/0006437 (2004-01-01), Lam et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods and apparatus for inspecting materials does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for inspecting materials, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for inspecting materials will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4073280

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.