Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2005-10-24
2009-02-17
Lauchman, L. G (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237100, C356S237600
Reexamination Certificate
active
07492450
ABSTRACT:
A method for inspecting an object using a light measurement system that includes a light source and an imaging sensor. The method includes emitting light from the light source, dispersing light emitted from the light source into one of a diffraction pattern and an interference pattern, and imaging the patterned light onto the object using a lens.
REFERENCES:
patent: 3644047 (1972-02-01), Brown et al.
patent: 4377340 (1983-03-01), Green et al.
patent: 4452534 (1984-06-01), Gribanov et al.
patent: 4585947 (1986-04-01), Liptay-Wagner et al.
patent: 4643578 (1987-02-01), Stern
patent: 4686374 (1987-08-01), Liptay-Wagner et al.
patent: 4818108 (1989-04-01), Eppinger
patent: 4842411 (1989-06-01), Wood
patent: 5187539 (1993-02-01), Adachi et al.
patent: 5307151 (1994-04-01), Hof et al.
patent: 5504575 (1996-04-01), Stafford
patent: 5506676 (1996-04-01), Hendler et al.
patent: 5589942 (1996-12-01), Gordon
patent: 5594556 (1997-01-01), Vronsky et al.
patent: 5602645 (1997-02-01), Tabata et al.
patent: 5852672 (1998-12-01), Lu
patent: 6028671 (2000-02-01), Svetkoff et al.
patent: 6064759 (2000-05-01), Buckley et al.
patent: 6069703 (2000-05-01), Banet et al.
patent: 6417916 (2002-07-01), Dengler et al.
patent: 6487012 (2002-11-01), Khoshnevis et al.
patent: 6639685 (2003-10-01), Gu et al.
patent: 6678057 (2004-01-01), Harding et al.
patent: 6747783 (2004-06-01), Sandstrom
patent: 6768543 (2004-07-01), Aiyer
patent: 6828554 (2004-12-01), Hiroi et al.
patent: 6909105 (2005-06-01), Heintzmann et al.
patent: 7180588 (2007-02-01), Geshwind et al.
patent: 7292346 (2007-11-01), De Groot et al.
patent: 2002/0014577 (2002-02-01), Ulrich et al.
patent: 2005/0111726 (2005-05-01), Hackney et al.
Qingying Hu et al., “Shiny Parts Measurement Using Color Separation,” Oct. 24, 2005, 8 page Abstract, GE GRC Schenectady, NY.
DeMuth Russell Stephen
Harding Kevin George
Tait Robert William
Andes Esq. William Scott
Armstrong Teasdale LLP
General Electric Company
Lauchman L. G
Underwood Jarreas C
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