Methods and apparatus for inspecting an object

Details Methods and apparatus for inspecting an object Methods and apparatus for inspecting an object

2011-03-01

2011-03-01

Toatley, Gregory J (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

C356S237300

Reexamination Certificate

active

07898651

ABSTRACT:
A method for inspecting an object includes emitting light from at least one of a liquid crystal display (LCD) device and a liquid crystal on silicon (LCOS) device, phase-shifting light emitted from at least one of the LCD device and the LCOS device, projecting the phase-shifted light onto a surface of an object, receiving light reflected from the object surface with an imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.

REFERENCES:
patent: 4585947 (1986-04-01), Liptay-Wagner et al.
patent: 4686374 (1987-08-01), Liptay-Wagner et al.
patent: 5175601 (1992-12-01), Fitts
patent: 5307151 (1994-04-01), Hof et al.
patent: 5471308 (1995-11-01), Zeien
patent: 5581352 (1996-12-01), Zeien
patent: 5636025 (1997-06-01), Bieman et al.
patent: 6028671 (2000-02-01), Svetkoff et al.
patent: 6028672 (2000-02-01), Geng
patent: 6064759 (2000-05-01), Buckley et al.
patent: 6438272 (2002-08-01), Huang et al.
patent: 6456405 (2002-09-01), Horikoshi et al.
patent: 6639685 (2003-10-01), Gu et al.
patent: 6678057 (2004-01-01), Harding et al.
patent: 6788210 (2004-09-01), Huang et al.
patent: 6806983 (2004-10-01), Long
patent: 6876459 (2005-04-01), Tu et al.
patent: 7525669 (2009-04-01), Abdollahi
patent: 2002/0014577 (2002-02-01), Ulrich et al.
patent: 2003/0112447 (2003-06-01), Harding et al.
patent: 2005/0111726 (2005-05-01), Hackney et al.
patent: 2007/0115484 (2007-05-01), Huang et al.
patent: 198 52 149 (2000-05-01), None
patent: 1 351 034 (2003-10-01), None
patent: WO 93/08448 (1993-04-01), None
patent: WO 96/27115 (1996-09-01), None
patent: 99/34301 (1999-07-01), None
patent: 01/20539 (2001-03-01), None
EP Search Report, App. No. 06255441.5 (Feb. 12, 2007).
Hu, Qingying, et al., Shiny Parts Measurement Using Color Separation, 8 page abstract, GE GRC, Schenectady, Ny (Oct. 22, 2005).

Affiliated with

Also associated with

Rating

Methods and apparatus for inspecting an object does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for inspecting an object, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for inspecting an object will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2753149