Methods and apparatus for improving temperature drift of referen

Details Methods and apparatus for improving temperature drift of referen Methods and apparatus for improving temperature drift of referen

1996-03-12

1997-05-13

Nguyen, Matthew V.

Electricity: power supply or regulation systems

Self-regulating

Using a three or more terminal semiconductive device as the...

323907, G05F 316

Patent

active

056296126

ABSTRACT:
Methods and apparatus for improving the temperature drift of references by providing temperature compensation trimmable after packaging of the integrated circuit. In accordance with the method, first, second and third trim parameters are generated and trimmed at wafer sort so that the first parameter is substantially independent of temperature, and at a nominal temperature, the second and third parameters are zero, with the second being proportional to the temperature rise above nominal and the third being proportional to temperature decrease below nominal. After packaging, a component of the first parameter is combined with the output of the reference to obtain the desired output at the nominal temperature, after which a component of the second parameter is combined with the output of the reference to obtain the desired output at a temperature above the nominal temperature, and a component of the third parameter is combined with the output of the reference to obtain the desired output at a temperature below the nominal temperature. The compensation is made permanent by blowing fuses. Various embodiments are disclosed.

REFERENCES:
patent: 4176308 (1979-11-01), Dobkin et al.
patent: 4249122 (1981-02-01), Widlar
patent: 4277739 (1981-07-01), Priel
patent: 4447784 (1984-05-01), Dobkin
patent: 4769589 (1988-09-01), Rosenthal
patent: 5148099 (1992-09-01), Ong
patent: 5220273 (1993-06-01), Mao
patent: 5373226 (1994-12-01), Kimura

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