Optics: measuring and testing – By polarized light examination
Patent
1998-10-08
1999-07-06
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
600316, 600322, 356367, G01J 400, A61B 500
Patent
active
059203935
ABSTRACT:
Methods and devices for determining the identity and concentration of constituent compounds within a test specimen. The methods are based on the principle that a specific compound in a specific concentration will modify a pattern of incident polychromatic light in a manner that is recognizable. The system includes a polychromatic light source directed first through an incident light pattern generator and then through the test specimen. Reflected and transmitted light components then pass through a pattern recognition gating device that selects portions of the light for analysis by an array of detectors. The methods include producing a modulated pattern of incident light specific for a particular compound of interest and selectively analyzing the reflected or transmitted light according to known patterns for that compound in specific concentrations. Modulated incident light patterns include variations in wavelength (typically non-absorbing for the compound), variations in partial polarization, as well as modulation of phase, amplitude, sampling frequency, and polarization frequency. The selective pattern analysis includes spectral scanning for identification of specific wavelength amplitudes as well as a second polarizer for accurately identifying polarization shifts. The detector array identifies specific scattering angles associated with each of the various analyzed light conditions. The patterns are sufficiently unique to be recognizable for a given compound regardless of the presence of additional compounds within the test specimen.
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