Methods and apparatus for identification and imaging of...

X-ray or gamma ray systems or devices – Electronic circuit – With display or signaling

Reexamination Certificate

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C378S005000, C378S053000

Reexamination Certificate

active

06987833

ABSTRACT:
A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.

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