X-ray or gamma ray systems or devices – Electronic circuit – With display or signaling
Reexamination Certificate
2006-01-17
2006-01-17
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Electronic circuit
With display or signaling
C378S005000, C378S053000
Reexamination Certificate
active
06987833
ABSTRACT:
A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.
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Du Yanfeng
Tkaczyk John Eric
Fletcher Yoder
General Electric Company
Ho Allen C.
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