Methods and apparatus for frequency response analysis

Details Methods and apparatus for frequency response analysis Methods and apparatus for frequency response analysis

1982-12-01

1985-04-09

Tokar, Michael J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

324 77B, 324 77R, G01R 2316

Patent

active

045104409

ABSTRACT:
In a heterodyning arrangement to enable frequency response testing of a system at a high frequency F using a digital correlator capable of operation at a lower frequency F/h, an offset signal is generated at a frequency F(h-1)/h and multiplied with the output signal of the system under test. Two heterodynes result: a wanted signal at a frequency F/h, and an unwanted image signal at F(2h-1)/h. The value of h is selectable independently of a divisor N which controls derivation of the test frequency F from a frequency synthesizer operating at a frequency NF. Thus the frequency of the image signal can be arranged to avoid spurious non-zero responses in the digital correlation process at frequencies related to N.

REFERENCES:
patent: 3808526 (1974-04-01), Jackson
patent: 3988667 (1976-10-01), Roth
patent: 4023098 (1977-05-01), Roth
patent: 4104725 (1978-08-01), Rose

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