Methods and apparatus for facilitating scan testing of asynchron

Details Methods and apparatus for facilitating scan testing of asynchron Methods and apparatus for facilitating scan testing of asynchron

1990-11-13

1992-11-24

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 223, 371 226, G01R 3128

Patent

active

051666049

ABSTRACT:
Scan testing of asynchronous logic circuitry is facilitated by gating off the asynchronous inputs to flip-flops during scan testing. If desired, the asynchronous inputs which are gated off in this manner may themselves terminals or scan registers during testing. Alternatively, the asynchronous inputs which are gated could be tested by selectively enabling the signals at strategic points during scan testing. The number of input terminals required to control the test mode may be reduced by providing registers for storing test control signals applied to normal input terminals at the beginning of a test cycle. Once these test control signals are stored, the normal input terminals are free to return to their normal use.

REFERENCES:
patent: 4484329 (1984-11-01), Slamka et al.
patent: 4556840 (1985-12-01), Russell
patent: 4580137 (1986-04-01), Fiedler et al.
patent: 4649539 (1987-03-01), Crain et al.
patent: 4701921 (1987-10-01), Powell et al.
patent: 4780666 (1988-10-01), Sakashita et al.
patent: 4856002 (1989-08-01), Sakashita et al.
patent: 4862068 (1989-08-01), Kawashima et al.
patent: 4864579 (1989-09-01), Kishida et al.
patent: 5008618 (1991-04-01), Van Der Star
patent: 5047710 (1991-09-01), Mahoney

Affiliated with

Also associated with

Rating

Methods and apparatus for facilitating scan testing of asynchron does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for facilitating scan testing of asynchron, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for facilitating scan testing of asynchron will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-924499