Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Patent
1997-07-25
1999-12-07
Martin-Wallace, Valencia
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
257209, H01L 2900
Patent
active
059988533
ABSTRACT:
Semiconductor integrated circuits are electrically marked at final test time to form a permanent, visually and electrically readable record of the test results. The electrical record can provide a simple good/bad indication, i.e. indicate whether or not the device passed final test. This provides for more efficient handling of failed devices returned from the field, as the manufacturer can immediately determine whether the device in question passed final test before shipment--or inadvertently "escaped" from the manufacturer. The electrical marking technique, preferably using one or more fuses on board the device, can be used to record quiescent current test, speed sort test and various other final test results. These and other test results recorded on the chip are useful to quality and reliability studies, and in reducing the time and effort required to determine the failure mode of a returned device.
REFERENCES:
patent: 4210875 (1980-07-01), Beasom
patent: 5698887 (1997-12-01), Kumano et al.
patent: 5780918 (1998-07-01), Aoki
LSI Logic Corporation
Martin-Wallace Valencia
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