Methods and apparatus for diagnosing defect locations in...

Details Methods and apparatus for diagnosing defect locations in... Methods and apparatus for diagnosing defect locations in...

2005-11-01

2005-11-01

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S555000

Reexamination Certificate

active

06960917

ABSTRACT:
In a method for testing continuity of electrical paths through a connector, pairs of contacts of the connector are coupled via a first plurality of passive circuit components. The contacts are also coupled to a test sensor port via a second plurality of passive circuit components, ones of which are coupled in parallel to the test sensor port. The method proceeds with stimulating one or more nodes of the connector, and then measuring an electrical characteristic via the test sensor port. Finally, the measured electrical characteristic is compared to at least one threshold to assess continuities of at least two electrical paths through the connector.

REFERENCES:
patent: 5254953 (1993-10-01), Crook et al.
patent: 5391993 (1995-02-01), Khazam et al.
patent: 5420500 (1995-05-01), Kerschner
patent: 5498964 (1996-03-01), Kerschner et al.
patent: 5557209 (1996-09-01), Crook et al.
patent: 5631572 (1997-05-01), Sheen et al.
patent: 6087842 (2000-07-01), Parker et al.
patent: 6097203 (2000-08-01), Parker et al.
patent: 53096786 (1978-08-01), None
patent: 02143188 (1990-06-01), None
patent: WO 99/39395 (1999-08-01), None
Kenneth P. Parker, et al., “Methods and Apparatus for Testing Continuity of Electrical Paths Through Connectors of Circuit Assemblies”, U.S. Appl. No. 10/683,693, filed Oct. 9, 2003.

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