Data processing: artificial intelligence – Neural network – Learning task
Reexamination Certificate
2008-05-13
2008-05-13
Holmes, Michael B. (Department: 2121)
Data processing: artificial intelligence
Neural network
Learning task
C706S020000, C706S021000
Reexamination Certificate
active
07373332
ABSTRACT:
Techniques for detecting temporal process variation and for managing and predicting performance of automatic classifiers applied to such processes using performance estimates based on temporal ordering of the samples are presented.
REFERENCES:
patent: 4287766 (1981-09-01), Ensminger
patent: 4641527 (1987-02-01), Hiroi et al.
patent: 4876455 (1989-10-01), Sanderson et al.
patent: 4988202 (1991-01-01), Nayar et al.
patent: 4999499 (1991-03-01), Bhatt
patent: 5335291 (1994-08-01), Kramer et al.
patent: 5720003 (1998-02-01), Chiang et al.
patent: 5963662 (1999-10-01), Vachtsevanos et al.
patent: 6081796 (2000-06-01), Takagi et al.
patent: 6269179 (2001-07-01), Vachtsevanos et al.
patent: 6487276 (2002-11-01), Rosen et al.
patent: 6548790 (2003-04-01), Trucco
patent: 6818862 (2004-11-01), Uetani et al.
patent: 6901137 (2005-05-01), Rosen et al.
patent: 7019826 (2006-03-01), Vook et al.
patent: 7099435 (2006-08-01), Heumann et al.
patent: 7149320 (2006-12-01), Haykin et al.
patent: 7171037 (2007-01-01), Mahon et al.
G. M. Weiss and H. Hirsh, Learning to Predict Rare Events in Categorical Time-Series Data, 1998, Papers from the 1998 AAAI Workshop—Predicting the Future: AI Approaches to Time-Series Problems, Technical Report WS-98-07, AAAI Press, pp. 83-90.
A tiered-color illumination approach for machine inspection of solder joints Capson, D.W.; Eng, S.-K.; Pattern Analysis and Machine Intelligence, IEEE Transactions on vol. 10, Issue 3, May 1988 pp. 387-393 Digital Object Identifier 10.1109/34.3902.
Automatic visual solder joint inspection Besl, P.; Delp, E.; Jain, R.; Robotics and Automation, IEEE Journal of [legacy, pre—1988] vol. 1, Issue 1, Mar. 1985 pp. 42-56.
Automatic visual inspection of solder joints Besl, P.; Delp, E.; Jain, R.; Robotics and Automation. Proceedings. 1985 IEEE International Conference on vol. 2, Mar. 1985 pp. 467-473.
Defect free assembly of SMT devices Desai, H.; Electrical Insulation Conference, 1997, and Electrical Manufacturing & Coil Winding Conference. Proceedings Sep. 22-25, 1997 pp. 677-682 Digital Object Identifier 10.1109/EEIC.1997.651278.
Heumann John M.
Li Jonathan Q.
Agilent Technologie,s Inc.
Holmes Michael B.
LandOfFree
Methods and apparatus for detecting temporal process... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods and apparatus for detecting temporal process..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for detecting temporal process... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2806617