Methods and apparatus for detecting defects in imaging...

Details Methods and apparatus for detecting defects in imaging... Methods and apparatus for detecting defects in imaging...

2011-08-30

2011-08-30

Hannett, James M (Department: 2622)

Television

Camera, system and detail

Combined image signal generator and general image signal...

C348S247000

Reexamination Certificate

active

08009209

ABSTRACT:
Methods for detecting defective pixels in imaging arrays involve establishing probabilities that individual pixels are defective and updating those probabilities by analysing images acquired by the imaging arrays. Probabilities may be evaluated for each of two or more defect conditions. The methods may be used to detect defects such as stuck-low, stuck-high, high-sensitivity, low sensitivity, hot, and defect-free conditions. Other more complicated defect conditions can also be detected. Apparatus for detecting defective pixels may be integrated with a camera or other imaging device or provided separately.

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