Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2011-08-16
2011-08-16
Kundu, Sujoy (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S084000, C702S117000, C702S118000, C702S119000, C702S120000, C702S121000, C702S122000, C702S123000, C702S124000, C702S182000, C702S183000, C700S055000, C714S721000, C438S010000, C438S011000, C438S012000, C438S013000, C438S014000
Reexamination Certificate
active
08000928
ABSTRACT:
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
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Buxton Paul
Gorin Jacky
Scott Michael J.
Tabor Eric Paul
Kundu Sujoy
Test Advantage, Inc.
The Noblitt Group PLLC
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