Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2011-03-08
2011-03-08
Lau, Tung S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
Reexamination Certificate
active
07904279
ABSTRACT:
Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
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LaBonte Greg
Miguelanez Emilio
Scott Michael J.
Lau Tung S
Test Advantage, Inc.
The Noblitt Group PLLC
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