Methods and apparatus for correlating stuck-at fault test covera

Details Methods and apparatus for correlating stuck-at fault test covera Methods and apparatus for correlating stuck-at fault test covera

1995-09-29

1998-01-27

Beausoliel, Jr., Robert W.

Excavating

371 226, 324765, G01R 3128

Patent

active

057128570

ABSTRACT:
Stuck-at faults are identified as being well covered by a current leakage fault test by correlating potential leakage faults with potential stuck-at faults in accordance with one of several correlation or comparison methods. In a path-correlation method, a stuck-at fault is identified as being well covered by a leakage test if the leakage test covers all leakage faults having terminals connected to a signal path from the input to the output of a logic gate subject to a stuck-at fault. In an associated-correlation method, the stuck-at fault is identified as being well covered by the leakage test, if the leakage test covers all faults having a terminal connected to the input of the gate subject to the stuck-at fault. In the all-correlation method, the stuck-at fault is identified as being well covered by the current leakage test if the current leakage test covers all leakage faults possibly occurring anywhere within the logic gate subject to the stuck-at fault. With any of the three methods, redundant fault testing can be predicted and substantially eliminated. In particular, expensive and time consuming stuck-at tests may be reduced in scope to test substantially only these stuck-at faults not well covered by a less expensive current leakage test.

REFERENCES:
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patent: 5371457 (1994-12-01), Lipp
patent: 5383194 (1995-01-01), Sloan et al.
patent: 5390193 (1995-02-01), Millman et al.
patent: 5420522 (1995-05-01), Smayling
patent: 5483544 (1996-01-01), Shur
patent: 5554941 (1996-09-01), Kesel

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