Methods and apparatus for conducting high g-force testing

Details Methods and apparatus for conducting high g-force testing Methods and apparatus for conducting high g-force testing

2006-03-07

2006-03-07

Noori, Max (Department: 2855)

Measuring and testing

Testing by impact or shock

Specimen impactor detail

Reexamination Certificate

active

07007540

ABSTRACT:
A high-g shock-producing device for testing a sample specimen is described which includes a beam and a shock column. The beam is of predetermined length and has at least one end substantially rigidly fixed with the specimen mounted thereon at a position remote from the one end. The shock column is positioned to apply a force causing said beam to bend in a direction transverse to the length. The column is configured to have a buckling failure when exposed to a pressure which is sufficient to bend the beam an amount to provide the desired high-g force to the specimen. The buckling failure causes the force to be suddenly removed from the beam so as to release the beam and produce the high-g shock on the specimen.

REFERENCES:
patent: 3589682 (1971-06-01), Dickey
patent: 4426683 (1984-01-01), Kissell
patent: 4433570 (1984-02-01), Brown et al.
patent: 4884456 (1989-12-01), Meline et al.
patent: 5341943 (1994-08-01), Fraser
patent: 5487298 (1996-01-01), Davis et al.
patent: 5677494 (1997-10-01), Keener et al.
patent: 5744947 (1998-04-01), Jacobsen et al.
patent: 6408205 (2002-06-01), Renirie et al.
patent: 6553807 (2003-04-01), Luk et al.
patent: 6655190 (2003-12-01), Grossman et al.
patent: 2003/0101794 (2003-06-01), Grossman et al.
International Search Report and the Written Opinion of the International Searching Authority, or the Declaration, dated Apr. 13, 2005; 12 pgs.

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