Methods and apparatus for bandwidth measurement and...

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

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C372S032000

Reexamination Certificate

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07639364

ABSTRACT:
A bandwidth meter method and apparatus for measuring the bandwidth of a spectrum of light emitted from a laser input to the bandwidth meter is disclosed, which may comprise an optical bandwidth monitor providing a first output representative of a first parameter which is indicative of the bandwidth of the light emitted from the laser and a second output representative of a second parameter which is indicative of the bandwidth of the light emitted from the laser; and, an actual bandwidth calculation apparatus utilizing the first output and the second output as part of a multivariable equation employing predetermined calibration variables specific to the optical bandwidth monitor, to calculate an actual bandwidth parameter. The actual bandwidth parameter may comprise a spectrum full width at some percent of the maximum within the full width of the spectrum of light emitted from the laser or a width between two points on the spectrum enclosing some percentage of the energy of the full spectrum of the spectrum of light emitted from the laser. The apparatus and method may be implemented in a laser lithography light source and/or in an integrated circuit lithography tool.

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“Understanding chromatic aberration impacts on lithographic imaging”, K.Lai, I. Lalovic, R.Fair, A.Kroyan, C. Progler, N. R. Farrar, D. Ames, K. Ahmed,J. Microlithography, Microfabrication and Microsystems, vol. 2, Issue 2, pp. 105-111, 2003.
“Modeling the effects of excimer laser bandwidth on lithographic performance” A. Kroyan, J. J. Bendik, O. Semprez, N. R. Farrar, C. G. Rowan and C. A. Mack, SPIE vol. 4000,Optical Microlithography XIII, pp. 658-664, Mar. 2000.
European Search Report dated Jul. 23, 2009 from European Patent Application No. 04776567.2, filed on Jun. 26, 2003 (3 pages).

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