Methods and apparatus for analyzing flutter test data using...

Details Methods and apparatus for analyzing flutter test data using... Methods and apparatus for analyzing flutter test data using...

2005-09-20

2005-09-20

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S056000, C702S077000

Reexamination Certificate

active

06947858

ABSTRACT:
Methods and apparatus for analyzing flutter test data using damped sine curve fitting. In one embodiment, a plurality of data points are read, with each data point representing an amplitude versus a test time. A number “N” of damped sine waves to fit to the plurality of data points is determined, and the number “N” of damped sine waves is fit to the plurality of data points using a non-linear “N” damped sine wave fitting algorithm.

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