Methods and apparatus for aligning an etalon with a...

Details Methods and apparatus for aligning an etalon with a... Methods and apparatus for aligning an etalon with a...

2006-06-14

2008-08-12

Connolly, Patrick (Department: 2877)

Optics: measuring and testing

By light interference

Having partially reflecting plates in series

C356S454000

Reexamination Certificate

active

07411686

ABSTRACT:
A method and apparatus are disclosed for measuring a characteristic, e.g. spectral bandwidth, of a light beam. The apparatus may comprise an etalon for generating an interference pattern having at least one light cone, an arrangement of detector elements, the arrangement receiving a portion of the light cone and producing a signal indicative of the characteristic; and an auxiliary detector positioned to receive a portion of the light cone and produce a signal indicative of an alignment between the etalon and the linear arrangement.

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