Methods and apparatus for a semiconductor device

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S046000

Reexamination Certificate

active

06841406

ABSTRACT:
A method for increasing carrier concentration in a semiconductor includes providing a group III nitride semiconductor device, determining a wavelength that increases carrier concentration in the semiconductor device, and directing at least one infrared light source, at the determined wavelength, into a semiconductor device excitation band.

REFERENCES:
patent: 5536953 (1996-07-01), Dreifus et al.
patent: 5585957 (1996-12-01), Nakao et al.
patent: 5625634 (1997-04-01), Ukita et al.
patent: 5644156 (1997-07-01), Suzuki et al.
patent: 5696389 (1997-12-01), Ishikawa et al.
patent: 5739554 (1998-04-01), Edmond et al.
patent: 5764672 (1998-06-01), Ukita et al.
patent: 5920409 (1999-07-01), Chadi et al.
patent: 6020602 (2000-02-01), Sugawara et al.
patent: 6120600 (2000-09-01), Edmond et al.
patent: 6177674 (2001-01-01), Rutt et al.
patent: 6198091 (2001-03-01), Forrest et al.
patent: 6221684 (2001-04-01), Sugawara et al.
patent: 6235548 (2001-05-01), Ota et al.
patent: 6297495 (2001-10-01), Bulovic et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods and apparatus for a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3432811

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.