Methods and apparatus for a flexible circuit interposer

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration

Reexamination Certificate

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C174S255000, C174S260000

Reexamination Certificate

active

11306657

ABSTRACT:
A flexible circuit interposer includes a flexible circuit substrate which allows in-situ probing of an attached device during, for example, circuit debugging, assembly qualification, and the like. A first set of pads (and optionally a fourth set of pads) is configured in a predetermined pattern on the bottom surface of a flexible substrate. Similarly, a second set of pads is configured in substantially the same pattern on the top surface of the flexible substrate, wherein the pads in the second set of pads is electrically continuous with a pad in the first set of pads. A third set of pads is configured in substantially the same pattern on the top surface of the flexible substrate. One or more conductive traces are formed to connect one or more pads in the third set of pads with one or more pads in the first or the second set of pads.

REFERENCES:
patent: 3923359 (1975-12-01), Newsam
patent: 6041495 (2000-03-01), Yoon et al.
patent: 6047469 (2000-04-01), Luna
patent: 6670700 (2003-12-01), Hashimoto
patent: 6765288 (2004-07-01), Damberg
patent: 6815621 (2004-11-01), Park et al.
patent: 7071420 (2006-07-01), Chambers

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