Telecommunications – Transmitter – Measuring – testing – or monitoring of transmitter
Reexamination Certificate
2011-07-05
2011-07-05
Hannon, Christian A (Department: 2618)
Telecommunications
Transmitter
Measuring, testing, or monitoring of transmitter
C455S115400, C370S279000, C375S297000
Reexamination Certificate
active
07974595
ABSTRACT:
One embodiment relates to an on-chip power amplifier (PA) test circuit. In one embodiment, a PA test circuit comprises a controllable oscillator (CO) configured to generate a radio frequency (RF) signal, a parallel resonant circuit tuned to the radio frequency, a pre-power amplifier (PPA) coupled to the CO and the parallel resonant circuit, the PPA configured to amplify and drive the RF signal from an output of the PPA into a load. The test circuit may further comprise a first transmission gate configured to couple the RF signal from the CO to an input of the PPA. One testing methodology for a PA test circuit comprises stressing the PPA with an RF signal, measuring a characteristic of the PPA, determining stress degradation from the characteristic measurements, and repeating the stressing and characteristic measurements until a maximum stress degradation is achieved or a maximum stress has been applied.
REFERENCES:
patent: 2006/0057980 (2006-03-01), Haque et al.
patent: 2007/0129029 (2007-06-01), Litmanen
Akhtar Siraj
Bhatia Karan Singh
Krishnan Srikanth
Marshall Andrew
Reddy Vijay Kumar
Brady III Wade J.
Franz Warren L.
Hannon Christian A
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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