Methodology for assessing degradation due to radio frequency...

Telecommunications – Transmitter – Measuring – testing – or monitoring of transmitter

Reexamination Certificate

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Details

C455S115400, C370S279000, C375S297000

Reexamination Certificate

active

07974595

ABSTRACT:
One embodiment relates to an on-chip power amplifier (PA) test circuit. In one embodiment, a PA test circuit comprises a controllable oscillator (CO) configured to generate a radio frequency (RF) signal, a parallel resonant circuit tuned to the radio frequency, a pre-power amplifier (PPA) coupled to the CO and the parallel resonant circuit, the PPA configured to amplify and drive the RF signal from an output of the PPA into a load. The test circuit may further comprise a first transmission gate configured to couple the RF signal from the CO to an input of the PPA. One testing methodology for a PA test circuit comprises stressing the PPA with an RF signal, measuring a characteristic of the PPA, determining stress degradation from the characteristic measurements, and repeating the stressing and characteristic measurements until a maximum stress degradation is achieved or a maximum stress has been applied.

REFERENCES:
patent: 2006/0057980 (2006-03-01), Haque et al.
patent: 2007/0129029 (2007-06-01), Litmanen

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