Electricity: measuring and testing – Of geophysical surface or subsurface in situ – Using electrode arrays – circuits – structure – or supports
Patent
1988-04-15
1989-05-30
Strecker, Gerard R.
Electricity: measuring and testing
Of geophysical surface or subsurface in situ
Using electrode arrays, circuits, structure, or supports
324350, G01V 304, G01V 308, G01V 338
Patent
active
048354732
ABSTRACT:
An electromagnetic survey method for geophysical exploration, in which the variations in the earth's magnetic field are measured in two, non-parallel directions at one point in the survey area. Simultaneously, the variations in the earth's electrical field parallel to the survey line are measured at a number of points along the survey line. These measured variations are transformed to the frequency domain, and then the horizontal component of the magnetic field orthogonal to the direction of the measured electrical field is calculated. The impedance at each measurement point on the survey line is calculated as a function of frequency, and weighted averages of the impedance for predetermined frequencies using a zero phase length weight function corresponding to a low pass filter applied to the electric field are used to calculate the subsurface conductivity distribution.
REFERENCES:
patent: 2314597 (1943-03-01), Phelan
patent: 2390270 (1945-12-01), Piety
patent: 2531088 (1950-11-01), Thompson
patent: 2677801 (1954-05-01), Cagniard
patent: 4041372 (1977-08-01), Miller et al.
patent: 4286218 (1981-08-01), Bloomquist et al.
patent: 4339720 (1982-07-01), Halverson
patent: 4449099 (1984-05-01), Hoehn
patent: 4757262 (1988-07-01), Bostick, Jr.
Board of Regents , The University of Texas System
Strecker Gerard R.
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