Method to transiently detect sample features using cantilevers

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Reexamination Certificate

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Reexamination Certificate

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07360405

ABSTRACT:
An approach to determine cantilever movement is presented. An observer based state estimation and statistical signal detection and estimation techniques are applied to Atomic Force Microscopes. A first mode approximation model of the cantilever is considered and an observer is designed to estimate the dynamic states. The cantilever-sample interaction is modeled as an impulsive force applied to the cantilever in order to detect the presence of sample. A generalized likelihood ratio test is performed to obtain the decision rule and the maximum likelihood estimation of the unknown arrival time of the sample profile and unknown magnitude of it. The use of the transient data results in sample detection at least ten times faster than using the steady state characteristics.

REFERENCES:
patent: 6845190 (2005-01-01), Smithwick et al.
patent: 7066014 (2006-06-01), Salapaka et al.
patent: 7165445 (2007-01-01), Bocek et al.
patent: 11-007307 (1999-01-01), None
JP11-007307-A, machine-assisted English language translation.
Chen, G. Y. et al. “Resonance response of scanning force microscopy cantilevers” Rev. Sci. INstrum vol. 65, No. 8, Aug. 1994, pp. 2532-2537.
Chon, James W. M. et al. “Experimental validation of theoretical models for the frequency response of atomic force microscope cantilever beams immersed in flids” J. Applied Phys. vol. 87, No. 8, Apr. 2000, pp. 3978-3988.
Tringe, J. W. et al. “Model-based Processing of Microcantilever Sensor Arrays”, May 17, 2005, UCRL-JRNL-212326, The institute of Electrical and Electronica Engineers Journal of Microelectromechanical Systems.
Greg Welch and Gary Bishop; An Introduction to the Kalman Filter; Paper; Updated Mar. 11, 2002; 16 pgs.
Martin Stark, Robert W. Stark, Wolfgang M. Heckl and Reinhard Guckenberger; Inventing dynamic force microscopy: From signals to time-resolved interaction forces; Paper—PNAS, Jun. 25, 2002; pp. 8473-8478; vol. 99, No. 13.
Woo Chun Choi and Nam Woong Kim; Experimental study on active vibration control of a flexible cantilever using an artificial neural-network state predictor; Paper; 1996; pp. 751-758; IOP Publishing Ltd.

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