Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-09-23
2011-10-18
Lau, Tung S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
08041519
ABSTRACT:
A method to produce an optical module, in particular, a module to transmit an analog data to enhance a yield thereof is disclosed. The method comprises (a) taking an I-L characteristic and its slope efficiency, (b) taking a gradient of a linear approximation between the slope efficiency and a current applied to an LD, and (c) taking an optimum current for the CSO characteristic as varying the current. Steps (a) to (c) give a correlation between the gradient of the linear approximation and the optimum current and are performed in advance to the practical production.
REFERENCES:
patent: 5802096 (1998-09-01), Okuda
patent: 6522460 (2003-02-01), Bonnedal et al.
Furumai Masaki
Kounosu Takashi
Satoh Shin
Yoshimura Satoshi
Lau Tung S
Smith , Gambrell & Russell, LLP
Sumitomo Electric Industries Ltd.
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