Method to monitor Meta-Paete cure on metallized substrates

Details Method to monitor Meta-Paete cure on metallized substrates Method to monitor Meta-Paete cure on metallized substrates

1992-09-10

1994-03-01

Beck, Shrive

Coating processes

Measuring, testing, or indicating

427521, 427557, 427 9, B05D 100

Patent

active

052905861

ABSTRACT:
Microreflectance infrared (IR) spectroscopy is used to determine the degree of cure of Meta-Paete (pyromellitic dianhydride-oxydianiline ethyl ester) films on metallized substrates. In this method, the infrared bands at 1028 and 1015 cm.sup.-1 are used to indirectly monitor ethanol evolution during Meta-Paete cure. The 1015 cm.sup.-1 band serves as internal reference, while the 1028 cm.sup.-1 band, which corresponds to the C--O stretch in the ethoxy group, is used to monitor imidization through loss of the ethoxy group during cure. Quantification of ethanol evolution is possible, since no apparent distortion is observed in the external reflection spectra at these two frequencies. The method can also be applied to measure the cure uniformity of Meta-Paete films, to provide an estimate of film thickness over metallized substrates, and to monitor temperature uniformity in an oven cavity.

REFERENCES:
patent: 3150264 (1964-09-01), Ehlert
patent: 3524983 (1970-08-01), Voelz
patent: 3930730 (1976-01-01), Laurens
patent: 4254337 (1981-03-01), Yasujima
patent: 4496697 (1985-01-01), Zsolnay et al.
patent: 4633087 (1986-12-01), Rosenthal et al.
patent: 4643910 (1987-02-01), Foutz
patent: 4777431 (1988-10-01), Day et al.
patent: 4874948 (1989-10-01), Cielo et al.
patent: 4891591 (1990-01-01), Johnston et al.
patent: 4984894 (1991-01-01), Kondo
R. D. Pierce et al "Thickness Measurements of Films on Transparent Substrates by Photoelectric Detection of Interference Fringes" Rev. Sci. Instrum. vol. 45, No. 1, Jan. 1974, pp. 14-15.
R. Ginsburg et al "Cure Monitor for Process Control" IBM Technical Disclosure Bulletin vol. 25, No. 8, Jan. 1983, p. 4355.
S. Guruswamy et al. "Radiation Curing of Organic Coatings" Metal Finishing, Jul. 1978, pp. 25-30.

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