Fishing – trapping – and vermin destroying
Patent
1991-03-15
1991-12-31
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437 56, 437 59, 437126, 437133, 148DIG9, 148DIG72, H01L 2118
Patent
active
050772317
ABSTRACT:
This is a method for fabricating integrated heterojunction bipolar transistors (HBTs) and heterojunction field effect transistors (HFETs) on a substrate. The method comprises: forming a subcollector layer 12 over the substrate 10; forming a collector layer 14 over the subcollector layer; forming a base layer 16 over the collector layer; etching the base layer to form one or more base pedestals 16 over a portion of the collector layer; forming a buffer region 18 in a portion of the collector layer over which one or more HFETs are fabricated; forming one or more channel regions 20,22 over the buffer region; forming a wide bandgap material emitter/gate layer 26 over the base pedestal and the channel region; forming isolation regions 30,32, whereby there is one or more separate HBTs and one or more separate HFETs over the substrate utilizing an epitaxially grown emitter/gate layer to form both an HBT emitter and an HFET gate. Other devices and methods are also disclosed.
REFERENCES:
patent: 4821090 (1989-04-01), Yokoyama
patent: 4830980 (1989-05-01), Hsieh
patent: 4929570 (1990-05-01), Howell
patent: 5012318 (1991-04-01), Honjo
Itakura et al., "A GaAs Bi-FET Technology For Large Scale Integration", IEDM, 1989, pp. 389-392.
K. Itakura et al.; A GaAs Bi-FET Technology for Large Scale Integration; IEEE 1989; pp. 15.2.1-15.2.4.
Morris Francis J.
Plumton Donald L.
Yang Jau-Yuann
Comfort James T.
Hearn Brian E.
Merrett N. Rhys
Nguyen Tuan
Sharp Melvin
LandOfFree
Method to integrate HBTs and FETs does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method to integrate HBTs and FETs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method to integrate HBTs and FETs will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1509967