Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-12-25
2007-12-25
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
10982366
ABSTRACT:
A manufacturer determines a maximum ambient temperature for an electronic device to be manufactured. The device has a data processor equipped with a utilization monitor. A test unit of the device is manufactured and placed under test at the maximum ambient temperature. The manufacturer during this test stage runs the application software for the electronic device at this time, in the test state. The temperature of the processor and its utilization reading are observed If the processor temperature increases out of range, then the software should be changed to utilize less processing capacity of the processor. A suitable reduction or adjustment in the software is determined, and the utilization amount is stored in memory. The electronic device is constructed with the alert circuitry and process. Hence, if the user should task the processor beyond the predetermined limit, the electronic device communicates that to the user.
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Gary Herbst, Hitachi's Drive Temperature Indicator Processor (Drive-TIP) helps ensure high drive reliability, Hitachi Global Storage Library, 2004.
Barlow John
Cook Alex McFarron Manzo Cummings & Mehler, Ltd.
Schweitzer Engineering Labortories, Inc.
Sievers Lisa
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