Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-09-13
2005-09-13
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C702S117000
Reexamination Certificate
active
06943560
ABSTRACT:
A method of testing a circuit having a plurality of one-time programmable cells. The method generally comprises the steps of (A) transmitting a plurality of addresses to the circuit and (B) receiving a plurality of values from the circuit each representing at least one of the one-time programmable cells in response to one of the addresses.
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patent: 6614703 (2003-09-01), Pitts et al.
patent: 2002/0044006 (2002-04-01), Jung et al.
“IEEE Standard Rest Access Port and Boundary-Scan Architecture”, IEEE Std 1149.1-2001 (Revision of IEEE Std 1149.1-1990), pp. 1-200.
Cypress Semiconductor Corp.
Deb Anjan
Dole Timothy J.
Maiorana PC Christopher P.
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