Method to evaluate whether a time delay is better than a...

Details Method to evaluate whether a time delay is better than a... Method to evaluate whether a time delay is better than a...

2003-10-01

2008-09-09

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Time duration or rate

C702S057000, C370S335000, C370S342000

Reexamination Certificate

active

07424390

ABSTRACT:
A method for testing the time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimitwith an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns time delays TD of the device are measured, thereby ne bad time delays of these ns time delays TD are detected. PDhighand/or PDloware obtained, whereby PDhighis the worst possible likelihood distribution and PDlowis the best possible likelihood distribution containing the measured ne bad time delays with the probability D. The average numbers of erroneous bits NEhighand NElowfor PDhighand PDloware obtained. NEhighand NEloware compared with NElimit=ERlimitns. If NElimitis higher than NEhighor NElimitis lower than NElowthe test is stopped.

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