Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-08-02
2011-08-02
Akhavannik, Hadi (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C378S004000, C250S302000
Reexamination Certificate
active
07991214
ABSTRACT:
The present invention provides an image enhancer that can be applied to various materials during quality testing. The image enhancer is adapted to infiltrate cracks, crevices, fractures, fissures, and other faults, defects, or flaws in the material and provide an increased contrast for images taken by, for example, an X-ray imaging device.
REFERENCES:
patent: 3316407 (1967-04-01), Ichikawa et al.
patent: 3704370 (1972-11-01), Shelton
patent: 3818229 (1974-06-01), Long, Jr.
patent: 4591478 (1986-05-01), Cohen et al.
patent: 7443953 (2008-10-01), Yun et al.
patent: 02098655 (1990-04-01), None
Chen, Ying, et al., “Automatic Extraction of Femur Contours from Hip X-ray Images,” pp. 1-10.
Hayes, Charles, “The ABC's of Nondestructive Weld Examination,” retrieved from http://www.ndt.net/article/0698/hayes/hayes.htm on Feb. 27, 2007, 10 pages.
“X-ray Contrast,” retrieved from http://www.mater-imaging.com.au/procedures/xray—contrast.html on Mar. 29, 2007, 2 pages.
Lau, John et al., “HDPUG's Failure Analysis of High-Density Packages' Lead-Free Solder Joints,” 11 pages.
Choi Jae H.
Evans James E.
Gilhousen Matthew
Woolley Mark D.
Akhavannik Hadi
Avaya Inc.
Sheridan & Ross P.C.
LandOfFree
Method to enhance X-ray and optical images and locate... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method to enhance X-ray and optical images and locate..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method to enhance X-ray and optical images and locate... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2757790