Method to determine phase and/or amplitude between...

Details Method to determine phase and/or amplitude between... Method to determine phase and/or amplitude between...

2011-08-23

2011-08-23

Kao, Chih-Cheng G (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Holography or interferometry

C378S019000, C378S062000

Reexamination Certificate

active

08005185

ABSTRACT:
In a method to determine phase and/or amplitude between interfering, adjacent x-ray beams in a detector pixel in a Talbot interferometer for projective and tomographical x-ray phase contrast imaging and/or x-ray dark field imaging, after an irradiation of the examination subject with at least two coherent or quasi-coherent x-rays, an interference of the at least two coherent or quasi-coherent x-rays with the aid of an irradiated phase grating is generated, and the variation of multiple intensity measurements in temporal succession after an analysis grating is determined in relation to known displacements of one of the gratings or of an x-ray source fashioned like a grating, positioned upstream in the beam path, relative to one of the gratings. The integrating intensity measurements ensue during a relative movement—thus not during the standstill—of one of the upstream gratings or of the x-ray source fashioned like a grating or of the examination subject, with known speed behavior over a final time interval of a final distance.

REFERENCES:
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patent: 2007/0153979 (2007-07-01), Baumann et al.
patent: 2009/0092227 (2009-04-01), David et al.
“X-ray Phase Imaging with a Grating Interferometer,” Weitkamp et al. Optic Express, vol. 13, No. 16, pp. 6296-6304, (2005).
“Hard-X-ray Dark-Field Imaging Using a Grating Interferometer,” Pfeiffer et al., Nature Materials, vol. 7 (2008), pp. 134-137.
“Phase-Measurement Interferometry Techniques,” Creath, Progress in Optics XXVI (1988) pp. 349-393.

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