Method to assess organoclay exfoliation and orientation in...

Chemistry: analytical and immunological testing – Optical result

Reexamination Certificate

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C422S082050, C436S174000, C436S171000

Reexamination Certificate

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11165948

ABSTRACT:
A method for determining degree of organoclay delamination and degree of layer alignment in a polymer organoclay nanocomposite comprising one or more infrared light spectral measurements selected from the group consisting of (A) Si—O absorption bandwidth, (B) Si—O absorption band intensity, (C) Si—O absorption band area, and (D) Si—O absorption anisotropy.

REFERENCES:
patent: 5554670 (1996-09-01), Giannelis et al.
Organoclay Complexes and Interactions (Shmuel Yariv et al.) published by Marcel Dekker Inc., New York (2002), pp. 345-348.
International Search Report for PCT/US2006/24061 dated Jan. 25, 2007.

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