Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2008-04-08
2008-04-08
Ramos-Feliciano, Eliseo (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S120000, C702S182000, C702S183000
Reexamination Certificate
active
11048965
ABSTRACT:
A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to measure the test coverage can range from a few instructions to all the instructions. The technique is easily integrated into existing test generation systems and is applicable to both uni- and multi-processing systems.
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Bohizic Theodore J.
Duale Ali Y.
Wittig Dennis W.
Cantor & Colburn LLP
Ortega Arthur
Ramos-Feliciano Eliseo
Suarez Felix
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