Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2007-05-01
2007-05-01
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C194S293000
Reexamination Certificate
active
11272234
ABSTRACT:
The invention provides a method, system, and program product for accommodating spatially-correlated variation in a process parameter during statistical timing of a circuit. In one embodiment, the method includes dividing an area of the circuit into a plurality of grid cells; associating an independent random variable with each of the plurality of grid cells; and expressing at least one spatially-correlated parameter of a first grid cell as a function of the random variables associated with the first grid cell and at least one neighboring grid cell.
REFERENCES:
Agarwal et. al. “Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations,” ICCAD '03 Nov. 11-13, 2003, San Jose, California, pp. 900-907.
Khandelwal et al., “A General Framework for Accurate Statistical Timing Analysis Considering Correlations”, DAC 2005, Jun. 13-17, 2005, Anaheim, California, pp. 89-94.
Agarwal et al., “Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations”, ICCAD '03, Nov. 11-13, 2003, San Jose, California, pp. 900-907.
Zhang et al., “Statistical Timing Analysis with Extended Pseudo-Canonical Timing Model”, Proceedings of the Design, Automation and Test in Europe Conference and Exhibition (DATE '05).
Agarwal, A. et al., “Statistical Delay Computation Considering Spatial Correlations,” ACM/IEEE Asia-Pacific Design Automation Conference (ASP-DAC), Jan. 2003, pp. 271-276.
Chang, H. et al., “Statistical Timing Analysis Considering Spatial Correlations Using a Single Pert-Like Traversal,” Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2003, pp. 621-625.
Zhan, Y. et al., “Correlation-Aware Statistical Timing Analysis with Non-Gaussian Delay Distributions,” DAC, Jun. 13-17, 2005, California, USA, pp. 77-82.
Venkateswaran Natesan
Visweswariah Chandramouli
Zhang Lizheng
Zolotov Vladimir
Barlow John
Hoffman Warnick & D'Alessandro LLC
Kundu Sujoy
Perez-Pineiro Raphael
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