Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate
Reexamination Certificate
2008-09-30
2008-09-30
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Time duration or rate
C702S089000
Reexamination Certificate
active
11651156
ABSTRACT:
To provide a method of correcting time of event trace data which is capable of correcting a deviation in starting time for collection of trace data. A difference in clock running rate between machines is obtained as a clock skew value by carrying out communications among a plurality of machines to be corrected a plurality of times and by storing operations of each operation as trace data and a required period of time for communications using trace data of a plurality of machines based on data on time when communications are performed and on a required period of time for communications. A time stamp value is corrected by using the obtained clock skew value so that operations of the time stamp coincide with each other.
REFERENCES:
patent: 2003/0145125 (2003-07-01), Horikawa
patent: 2005/0193277 (2005-09-01), Horikawa et al.
patent: 2003-157185 (2003-05-01), None
patent: 2005-235054 (2005-09-01), None
NEC Corporation
Nghiem Michael P
Scully , Scott, Murphy & Presser, P.C.
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