Method, system and computer product for plaque characterization

Details Method, system and computer product for plaque characterization Method, system and computer product for plaque characterization

2005-07-26

2005-07-26

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

C378S098900, C378S098120

Reexamination Certificate

active

06922462

ABSTRACT:
A method for plaque characterization. The method comprises obtaining a first set of image data created in response to a first x-ray energy level and including a plurality of pixel elements. Each of the first pixel elements corresponds to a unique location in an object being scanned. The method further comprises obtaining a second set of image data created in response to a second x-ray energy level and including a plurality of second pixel elements. Each of the second pixel elements corresponds to one of the first pixel elements and the second x-ray energy level is higher than the first x-ray energy level. The method also comprises calculating a third set of image data in response to the first set of image data and the second set of image data. The calculating includes subtracting each second pixel element from the corresponding first pixel element.

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