Excavating
Patent
1997-09-30
1998-07-14
Nguyen, Ho T.
Excavating
G01R 3128
Patent
active
057815623
ABSTRACT:
An apparatus generates patterns useful for testing storage devices using a modified form of a shift register. A control input and two bits are added and the least significant bit of the result is substituted in place of one of the bits which are rotatably shifted to generate subsequent patterns. The patterns generated may be used to test storage devices by writing the pattern to the storage device, reading the device and comparing the pattern read with the pattern written. A difference indicates a storage device error.
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Fujitsu Limited
Nguyen Ho T.
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