Measuring and testing – Gas analysis – Gas chromatography
Patent
1982-09-29
1984-12-04
Kreitman, Stephen A.
Measuring and testing
Gas analysis
Gas chromatography
73 27R, 422 98, 338 34, G01N 2700
Patent
active
044856679
ABSTRACT:
An enclosure (17) contains two ovens (18, 19) each containing a semiconductor metal oxide (SnO.sub.2 or NiO) sensor (13) previously activated using H.sub.2 S or SO.sub.2. The sensors (13) are heated to different temperatures the lower of which corresponds to a peak on the sensor conductivity curve characteristic of the gas. The signals produced are applied to a comparator (30). For many toxic gases this peak occurs at concentrations below their toxicity threshold in air.
REFERENCES:
patent: 3999947 (1976-12-01), Mihara et al.
patent: 4169369 (1979-10-01), Chang
patent: 4250737 (1981-02-01), Biglin
Couput Jean-Paul
Lalauze Rene
Pijolat Christophe
Association pour la Recherche et la Developpement des Methodes e
Baker Joseph J.
Ferguson Jr. Gerald J.
Kovalick Vincent P.
Kreitman Stephen A.
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