Method of wet etching aluminum oxide to minimize undercutting

Etching a substrate: processes – Masking of a substrate using material resistant to an etchant

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216 49, 216 51, 216102, 216101, 216 17, 216751, 216754, 216778, 216700, 216764, H01L 2144

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058766146

ABSTRACT:
The method of wet etching an aluminum oxide substrate deposits a thin layer of titanium film or chromium film on the aluminum oxide surface prior to the application of the photo-resist coating to form a barrier between the aluminum oxide and the photo-resist. This barrier layer inhibits the reaction between the aluminum oxide and the photo-resist during the photolithographic process. The undercutting of the aluminum oxide in the wet etching process is therefore controlled by the deposition of the barrier layer comprising the thin layer of titanium film or chromium film. The titanium film used is nominally 30 .ANG. thick to obtain the beneficial effects noted above while the chromium film would be approximately 1000 .ANG. thick.

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patent: 5449635 (1995-09-01), Jun
patent: 5470793 (1995-11-01), Kalnitsky
patent: 5635423 (1997-06-01), Huang et al.

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