Method of visualizing minute particles

Details Method of visualizing minute particles Method of visualizing minute particles

1994-01-07

1996-02-27

Pham, Hoa Q.

Optics: measuring and testing

By polarized light examination

With light attenuation

356379, 356237, 348126, G01B 1124

Patent

active

054953375

ABSTRACT:
The visualization method includes generating a relatively wide beam of light directed onto an object to be inspected and determining the center of intensity of the wide beam of light reflected from the object for facilitating geometric dimensional calculations of a large number of such objects, such as solder deposits on the surface of a printed circuit board, in a very short period of time and in a very accurate manner.

REFERENCES:
patent: 4105925 (1978-08-01), Rossol et al.
patent: 4573073 (1986-02-01), Corby, Jr.
patent: 4627734 (1986-12-01), Rioux
patent: 4705401 (1987-11-01), Addleman et al.
patent: 4767212 (1988-08-01), Kitahashi et al.
patent: 4798964 (1989-01-01), Schmalfuss et al.
patent: 5102224 (1992-04-01), Uesugi et al.

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